Markets
Exhibitions
- ACHEMA - Germany
Frankfurt am Main (18 - 22 June 2012) - WORLD GAS CONFERENCE - Malaysia
Kuala Lumpur (4 - 8 June 2012) - ANALYTICA - Germany
Munich (17 - 20 April 2012) - IE EXPO (中国环博会) - CHINA
(7 - 9 March 2012) - POLLUTEC 2011 - FRANCE
Paris Nord Villepinte (29 Nov. - 2 Dec. 2011) - CEM 10th International Conference and Exhibition on Emissions Monitoring - The Czech Republic
Corinthia Prague Hotel - Prague (5 - 7 October 2011)
Conferences & Posters
- In progress certification of in situ gas chromatographs measuring Benzene in compliance with EN 14662-3
(3 - 6 october 2011) - New environmental metrology on VOC ozone precursors in ambient air
(22 - 25 June 2011) - SULFUR COMPOUNDS ANALYSIS FOR ATMOSPHERIC EMISSION CONTROL IN A PAPER MILL
(11 - 14 April 2011) - Gas Shipping and Storage Operation Safety
(21 - 24 March 2011)
Peripheral equipment – new document
Getting an instrument to accurately measure trace impurities continuously on line (low ppm, ppb or even ppt) can end up being a costly and difficult experience if the recommended ancillary equipment is not used. Measured molecules such as sulfur compounds and VOCs require special handling in order for the instrument to provide the most precise measurement.
Our many years of experience have allowed us to design and test complete analysis systems. We have reflected this experience in a new document to promote the recommended items we supply for use with our market leading analysers.
These important items include, gas generators, sampling systems, calibration modules, computer software and special design systems that enable us to offer complete turnkey solutions.
If you would like further information or a copy of our new peripheral equipment document, please contact us.